Analysis (XRF) from sample OM18-30
Method | XRF |
Person/Institution | Pajusaar, Siim |
Sample number | OM18-30 |
Locality | Jägala waterfall |
Depth | 2.75 |
Depth to | 2.8 |
Stratigraphy | Volkhov Stage |
Lithostratigraphy | Toila Formation |
Institution | Department of Geology, TalTech |
Date added | 2021-11-26 |
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