Analysis (XRF) from sample 77710
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 677.75
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]10.17
SiO2 [%]54
TiO2 [%]0.73
Al2O3 [%]14.9
Fe2O3 [%]4.91
MnO [%]0.043
MgO [%]3.95
CaO [%]7.24
Na2O [%]0.85
K2O [%]4.25
P2O5 [%]0.09
Cl [%]0.08
S [%]0.68
SUM [%]101.3
As [ppm]9
Ba [ppm]322
Bi [ppm]<10
Br [ppm]4.2
Ce [ppm]52
Cr [ppm]81.9
Cu [ppm]<100
Ga [ppm]19.3
La [ppm]51
Mo [ppm]4.9
Nb [ppm]16.4