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Microscope image of the thick section under reflected light. Uhtna F-232, depth 437.5 m. | File
Author: Solano Acosta, Juan David
Date:
DescriptionMicroscope image of the thick section under reflected light. Uhtna F-232, depth 437.5 m.
AuthorSolano Acosta, Juan David
Date2022
TypeImage (Photo)
Formatimage/jpg
InstitutionDepartment of Geology, TalTech
Date added2023-02-21
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