Analysis (ICPMS) from sample Sõtke 23.82-23.84
General info
Method ICPMS
Person/Institution Urtson, Kristjan
Sample number
Locality
Depth 23.82
Depth to 23.84
Stratigraphy
Lithostratigraphy
Institution Department of Geology, TalTech
Date added 2020-11-23
Results
ParameterValueTextError
Ag [ppm]0.68256124250.01998
As [ppm]547.90698422583.29264
Ba [ppm]285.59412597031.90774
Be [ppm]0.81729356010.11981
Bi [ppm]<0,040.00286
Cd [ppm]0.91309270540.01428
Ce [ppm]135.41430714070.61148
Co [ppm]32.3241024460.25004
Cr [ppm]13.49416921820.17603
Cs [ppm]0.41197936090.02078
Cu [ppm]66.35499527820.49989
Dy [ppm]14.96025201810.08501
Er [ppm]7.23434596740.04673
Eu [ppm]3.91904946180.08425
Ga [ppm]2.44403776180.02198
Gd [ppm]18.60574234970.16059
Hf [ppm]1.10903960580.0212
Ho [ppm]2.94408846560.0119
La [ppm]53.0470204350.4315
Lu [ppm]0.61789568640.01439
Mn [ppm]849.34201827466.47781
Mo [ppm]104.68269853310.53614
Nb [ppm]2.33472338750.03062
Nd [ppm]79.05679610.36351
Ni [ppm]453.59920931724.76491