Analysis (XRF) from sample 101783
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 70.55
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]12.62
SiO2 [%]50.1
TiO2 [%]0.758
Al2O3 [%]15.25
Fe2O3 [%]4.17
MnO [%]0.029
MgO [%]3.27
CaO [%]6.84
Na2O [%]0.13
K2O [%]6.96
P2O5 [%]0.012
Cl [%]0.024
S [%]0.41
SUM [%]100.5
As [ppm]1
Ba [ppm]312
Br [ppm]4
Ce [ppm]14
Co [ppm]8
Cr [ppm]76
Cu [ppm]8
F [%]0.1
Ga [ppm]18.3
Ge [ppm]1
La [ppm]11