Analysis (XRF) from sample 101771
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 43.6
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]2.34
SiO2 [%]60.7
TiO2 [%]1.111
Al2O3 [%]18.1
Fe2O3 [%]1.42
MnO [%]0.011
MgO [%]0.8
CaO [%]1.05
Na2O [%]0.26
K2O [%]14.14
P2O5 [%]0.256
Cl [%]0.022
S [%]0.453
SUM [%]100.6
As [ppm]8
Ba [ppm]377
Br [ppm]2
Ce [ppm]52
Co [ppm]18
Cr [ppm]21
Cu [ppm]83
F [%]0.18
Ga [ppm]10.4
Ge [ppm]2
La [ppm]14