Analysis (XRF) from sample 101770
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 40.6
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]6.02
SiO2 [%]54.4
TiO2 [%]0.38
Al2O3 [%]21.06
Fe2O3 [%]1.69
MnO [%]0.005
MgO [%]2.78
CaO [%]0.5
Na2O [%]0.15
K2O [%]11
P2O5 [%]0.026
Cl [%]0.022
S [%]0.155
SUM [%]98.2
As [ppm]-1
Ba [ppm]105
Br [ppm]6
Ce [ppm]1
Co [ppm]4
Cr [ppm]8
Cu [ppm]116
F [%]0.33
Ga [ppm]14.8
Ge [ppm]1
La [ppm]-3