Analysis (XRF) from sample 101766
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 38.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]8.48
SiO2 [%]53.2
TiO2 [%]0.841
Al2O3 [%]22.34
Fe2O3 [%]1.83
MnO [%]0.004
MgO [%]3.3
CaO [%]0.66
Na2O [%]0.15
K2O [%]9.26
P2O5 [%]0.046
Cl [%]0.018
S [%]0.141
SUM [%]100.3
As [ppm]-6
Ba [ppm]145
Br [ppm]4
Ce [ppm]72
Co [ppm]10
Cr [ppm]5
Cu [ppm]4
F [%]0.37
Ga [ppm]17.4
Ge [ppm]2
La [ppm]15