Analysis (XRF) from sample 101553
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 352.5
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]7.8
SiO2 [%]51.5
TiO2 [%]1.963
Al2O3 [%]27.61
Fe2O3 [%]2.19
MnO [%]0.024
MgO [%]1.27
CaO [%]1.07
Na2O [%]0.36
K2O [%]7.04
P2O5 [%]0.395
Cl [%]0.165
S [%]0.196
SUM [%]101.6
As [ppm]4.8
Ba [ppm]646
Br [ppm]12.8
Ce [ppm]85
Co [ppm]15.4
Cr [ppm]23.2
Cu [ppm]11.6
F [%]0.18
Ga [ppm]13.9
Ge [ppm]1
La [ppm]5.3