Analysis (XRF) from sample 101548
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 347.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]3
SiO2 [%]55.62
TiO2 [%]2.501
Al2O3 [%]23.5
Fe2O3 [%]1.6
MnO [%]0.018
MgO [%]1.13
CaO [%]1.34
Na2O [%]0.43
K2O [%]10.32
P2O5 [%]0.552
Cl [%]0.156
S [%]0.179
SUM [%]100.3
As [ppm]3
Ba [ppm]5358
Br [ppm]12.8
Ce [ppm]243
Co [ppm]10.2
Cr [ppm]28.5
Cu [ppm]0.3
F [%]0.12
Ga [ppm]8.6
Ge [ppm]0
La [ppm]53