Analysis (XRF) from sample 101546
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 333.35
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]11.5
SiO2 [%]49.18
TiO2 [%]0.969
Al2O3 [%]30.77
Fe2O3 [%]2.09
MnO [%]0.006
MgO [%]1.58
CaO [%]0.72
Na2O [%]0.49
K2O [%]3.29
P2O5 [%]0.097
Cl [%]0.238
S [%]0.035
SUM [%]101
As [ppm]1.2
Ba [ppm]244
Br [ppm]26.8
Ce [ppm]23
Co [ppm]3.1
Cr [ppm]32.1
Cu [ppm]0.3
F [%]0.13
Ga [ppm]13
Ge [ppm]1
La [ppm]-4.8