Analysis (XRF) from sample 101545
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 328.1
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]22
SiO2 [%]24.4
TiO2 [%]0.274
Al2O3 [%]16.22
Fe2O3 [%]1.68
MnO [%]0.066
MgO [%]1.25
CaO [%]30
Na2O [%]0.27
K2O [%]1.17
P2O5 [%]0.032
Cl [%]0.174
S [%]0.336
SUM [%]97.9
As [ppm]3.9
Ba [ppm]11561
Br [ppm]16.3
Ce [ppm]20
Co [ppm]6.6
Cr [ppm]34.7
Cu [ppm]5.5
F [%]0.18
Ga [ppm]7.7
Ge [ppm]-1
La [ppm]19.1