Analysis (XRF) from sample 78416
Method | XRF |
Person/Institution | Kallaste, Toivo |
Sample number | 78416 |
Reference | Kiipli, T. et al., 2011a |
Locality | Paatsalu 527 borehole |
Depth | 81 |
Stratigraphy | Telychian |
Institution | Department of Geology, TalTech |
Date added | 2012-10-14 |
Date changed | 2012-10-14 |
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