Analysis (XRF) from sample 78396
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 181.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]4.68
SiO2 [%]55.8
TiO2 [%]0.73
Al2O3 [%]19.8
Fe2O3 [%]5.51
MnO [%]0.056
MgO [%]3.4
CaO [%]1.29
Na2O [%]0.2
K2O [%]8.25
P2O5 [%]0.245
SUM [%]100
Ce [ppm]127
Ga [ppm]20
La [ppm]31
Nb [ppm]15
Ni [ppm]34
Rb [ppm]104
Sr [ppm]86
Y [ppm]21
Zr [ppm]253