Analysis (XRF) from sample 78394
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 178.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2014-11-07
Results
ParameterValueTextError
LOI_920 [%]4.5
SiO2 [%]54.6
TiO2 [%]1.124
Al2O3 [%]21.3
Fe2O3 [%]7.28
MnO [%]0.027
MgO [%]2.9
CaO [%]0.7
Na2O [%]0.9
K2O [%]7.74
P2O5 [%]0.06
SUM [%]100.6
As [ppm]5
Ba [ppm]349
Bi [ppm]1
Br [ppm]5
Ce [ppm]255
Ga [ppm]20
Ge [ppm]-2
La [ppm]84
Nb [ppm]41
Ni [ppm]23
Pb [ppm]11
Rb [ppm]94
Se [ppm]0