Analysis (XRF) from sample 78389
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 171.95
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]6.12
SiO2 [%]51.4
TiO2 [%]0.458
Al2O3 [%]20.4
Fe2O3 [%]9.38
MnO [%]0.023
MgO [%]3.2
CaO [%]2.22
Na2O [%]0.4
K2O [%]6.51
P2O5 [%]0.068
SUM [%]99.9
Ce [ppm]224
La [ppm]89