Analysis (XRF) from sample 78384
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 148.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]2.63
SiO2 [%]58.9
TiO2 [%]1.217
Al2O3 [%]18.7
Fe2O3 [%]2.26
MnO [%]0.014
MgO [%]1.3
CaO [%]1.19
Na2O [%]0.9
K2O [%]12.33
P2O5 [%]0.359
SUM [%]99.9
As [ppm]29
Ba [ppm]340
Bi [ppm]9
Br [ppm]4
Ce [ppm]254
Ga [ppm]12
Ge [ppm]2
La [ppm]86
Nb [ppm]14
Ni [ppm]114
Pb [ppm]29
Rb [ppm]94
Se [ppm]3