Analysis (granulometry) from sample 75719
Methodgranulometry
Person/InstitutionKleesment
Sample number
Remarksgran. frakts., savi
Locality
Depth72
Depth to72.5
Stratigraphy
Lithostratigraphy
InstitutionDepartment of Geology, TalTech
Date added2006-03-14
Date changed2006-03-14
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