Analysis (granulometry) from sample 73370
Methodgranulometry
Person/InstitutionKleesment
Sample number
Remarksgran. frakts.
Locality
Depth109
Depth to110
Stratigraphy
Lithostratigraphy
InstitutionDepartment of Geology, TalTech
Date added2006-03-10
Date changed2013-03-15
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