Analysis (XRF) from sample 77720
General info
Method XRF
Person/Institution Kallaste, Toivo
Sample number
Reference Kiipli, T. et al., 2011a
Dataset Chemical composition of Ordovician and Silurian bentonites (XRF)
Locality
Depth 687.8
Stratigraphy
Institution Department of Geology, TalTech
Date added 2012-10-14
Date changed 2012-10-14
Results
ParameterValueTextError
LOI_920 [%]12.97
SiO2 [%]51.5
TiO2 [%]0.64
Al2O3 [%]14.5
Fe2O3 [%]4.31
MnO [%]0.039
MgO [%]4.09
CaO [%]8.86
Na2O [%]0.75
K2O [%]3.94
P2O5 [%]0.14
Cl [%]0.02
S [%]0.55
SUM [%]101.8
As [ppm]6.1
Ba [ppm]287
Bi [ppm]<10
Br [ppm]2.8
Ce [ppm]76
Cr [ppm]74
Cu [ppm]<100
Ga [ppm]17.8
La [ppm]60
Mo [ppm]3
Nb [ppm]15.3