Analüüs (XRF) proovist 100736
Üldinfo
| Metoodika | XRF |
| Proovi nr |
100736
|
| Andmeset | Tallinna ja lähiümbruse muldade geokeemiline kaardistamine |
| Sügavus | 0.2 |
| Stratigraafia |
Kvaternaar
|
| Asutus | TalTech geoloogia instituut |
| Kirje lisatud | 2012-10-12 |
| Kirje muudetud | 2012-10-12 |
Tulemused
| Parameeter | Väärtus | Tekst | Viga |
|---|---|---|---|
| SiO2 [%] | 86.39 | ||
| TiO2 [%] | 0.106 | ||
| Al2O3 [%] | 4.18 | ||
| Fe2O3 [%] | 0.84 | ||
| MnO [%] | 0.019 | ||
| MgO [%] | 0.22 | ||
| CaO [%] | 1.33 | ||
| Na2O [%] | 0.88 | ||
| K2O [%] | 1.21 | ||
| P2O5 [%] | 0.131 | ||
| SO3 [%] | 0.06 | ||
| Cl [%] | 0.005 | ||
| F [%] | 0.022 | ||
| LOI_1030 [%] | 4.33 | ||
| As [ppm] | 0.5 | ||
| Ba [ppm] | 226 | ||
| Ce [ppm] | 12 | ||
| Co [ppm] | 0.5 | ||
| Cr [ppm] | 22 | ||
| Cs [ppm] | 0.5 | ||
| Cu [ppm] | 12 | ||
| Ga [ppm] | 4 | ||
| Hf [ppm] | 0.5 | ||
| La [ppm] | 25 | ||
| Mo [ppm] | 0.5 |
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